Run automated inspections and have the tool present the probe card for Rework without the need to re-align, saving time and improving accuracy
With a few mouse clicks you can see the deviation of your pin tips from their nominal positions, and early identify patterns and trends
Easily point out outliers in your pin offsets
Our system reliably finds scrub marks, even in challenging conditions through multi-channel data acquistion
Fast, automated, with nm-resolution
Recognize and document process non-uniformities in a glance
With our advanced sensors, we reliably measure the exact tip shape and form, even steep sidewall angles.
We’re happy to measure yours, but unfortunately can’t show you the ones we’ve measured. We’re sure you understand…..
Size, Pitch, Entry Rounding, Taper, Exit and Entry.
Again, our multi-sensor technology approach provides superior measurements, but we’re not at liberty to show you examples. We’d be happy to run some of your samples so you can see what results our technology can provide on your samples.
Quite similar to many flatness measurements on wafers, we can scan even your largest Probe Cards and see if they are in Spec.
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Please contact us for more information and a free system demo
Email us at info@STRAMATEC.com