Probe Card Metrology & Rework

in a single tool

Measure and Rework

Run automated inspections and have the tool present the probe card for Rework without the need to re-align, saving time and improving accuracy

Map your X/Y Offsets in-tool

With a few mouse clicks you can see the deviation of your pin tips from their nominal positions, and early identify patterns and trends

Pin Offsets & Outliers

Easily point out outliers in your pin offsets

Inspect Scrub Marks

Our system reliably finds scrub marks, even in challenging conditions through multi-channel data acquistion

Scrub Mark Alignment, X/Y Offset, X & Y dimensions

Fast, automated, with nm-resolution

Tip Height & Distribution

Recognize and document process non-uniformities in a glance

Tip Shape Measurements

With our advanced sensors, we reliably measure the exact tip shape and form, even steep sidewall angles.

We’re happy to measure yours, but unfortunately can’t show you the ones we’ve measured. We’re sure you understand…..

Guide Plates

Size, Pitch, Entry Rounding, Taper, Exit and Entry.

Again, our multi-sensor technology approach provides superior measurements, but we’re not at liberty to show you examples. We’d be happy to run some of your samples so you can see what results our technology can provide on your samples.

Flatness

Quite similar to many flatness measurements on wafers, we can scan even your largest Probe Cards and see if they are in Spec.

We use cookies to improve your experience and to help us understand how you use our site. Please refer to our cookie notice and privacy statement for more information regarding cookies and other third-party tracking that may be enabled.

Contact Us

Please contact us for more information and a free system demo

Email us at info@STRAMATEC.com