Take a look how these measurements are done fully automatic, reliably and repeatable, every time!
Measure reliably and effortlessly, on blank, coated or patterned wafers.
Fast, across the entire wafer, with a few select points or high density scans to show the details
We offer a range of different platform sizes with a wide selection of sensor technologies to allow you to measure your samples
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Please contact us for more information and a free system demo
Email us at info@STRAMATEC.com