Interested in how to accurately measure your wafer
Total Thickness, TTV & Shape?
Click below for your free Applications Note
View our Tutorial
Take a look how these measurements are done fully automatic, reliably and repeatable, every time!
Warpage
Measure reliably and effortlessly, on blank, coated or patterned wafers.
Total Thickness and TTV
Fast, across the entire wafer, with a few select points or high density scans to show the details
The CT3X0 Platform -
Manual or automated loading
Visit our web site for more details
We offer a range of different platform sizes with a wide selection of sensor technologies to allow you to measure your samples
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Contact Us
Please contact us for more information and a free system demo
Email us at info@STRAMATEC.com
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