Interested in how to accurately measure your wafer

Total Thickness, TTV & Shape?

Click below for your free Applications Note

View our Tutorial

Take a look how these measurements are done fully automatic, reliably and repeatable, every time!

Warpage

Measure reliably and effortlessly, on blank, coated or patterned wafers.

Total Thickness and TTV

Fast, across the entire wafer, with a few select points or high density scans to show the details

The CT3X0 Platform -

Manual or automated loading

Visit our web site for more details

We offer a range of different platform sizes with a wide selection of sensor technologies to allow you to measure your samples

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Contact Us

Please contact us for more information and a free system demo

Email us at info@STRAMATEC.com

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