WATOM

SEMICONDUCTOR METROLOGY ON THE EDGE

FAST FACTS

Patented technology

Highest throughput

Highest accuracy

WATOM LS

Wafer Edge Measurement - pinpoint precise

WATOM CCD

Wafer Edge Measurement –
Reliable Projection Technology

WATOM T

Small footprint and consistent accuracy

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Contact Us

Please contact us for more information and a free system demo

Email us at info@STRAMATEC.com

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