WATOM
SEMICONDUCTOR METROLOGY ON THE EDGE
FAST FACTS
Patented technology
Highest throughput
Highest accuracy
WATOM LS
Wafer Edge Measurement - pinpoint precise
WATOM CCD
Wafer Edge Measurement –
Reliable Projection Technology
WATOM T
Small footprint and consistent accuracy
We use cookies to improve your experience and to help us understand how you use our site. Please refer to our cookie notice and privacy statement for more information regarding cookies and other third-party tracking that may be enabled.
Contact Us
Please contact us for more information and a free system demo
Email us at info@STRAMATEC.com
© 2024 STRAMATEC, LLC
