Compact, fast, high resolution, insusceptible to a wide range of vibration with the ability to measure steep slopes
Compact, fast, high resolution, not susceptible to vibration with the ability to measure steep slopes
With sub-nm resolution our systems offer the ultimate capability to measure even the smallest surface features and defects
Reliable and reproducible measurements on polished and highly reflective surfaces.
smartWLI can scan nano structures on larger areas with sub atomic height resolution and point densities down to 0.03 µm
Above measurements are taken on 2nd floor on a regular conference table, 1 minute apart, with the difference shown as less than 0.05 nm.
Try that with any other system!
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Please contact us for more information and a free system demo
Email us at info@STRAMATEC.com